DocumentCode :
3447257
Title :
Scanning tunneling microscopy of quantum confinement effects in lead sulfide thin films
Author :
Lee, Wonyoung ; Dasgupta, Neil P. ; Prinz, Fritz B.
Author_Institution :
Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
fYear :
2009
fDate :
7-12 June 2009
Abstract :
We report the use of the scanning tunneling spectroscopy (STS) to investigate 1-dimensional quantum confinement effects in lead sulfide (PbS) thin films. The band gap was varied by control of the PbS film thickness and barrier materials. PbS quantum well structures with a thickness range of 1-20 nm were prepared by atomic layer deposition (ALD) due to its unique characteristics: precise thickness control with sub-nm resolution, pinhole-free films, and conformal coating. Two barrier materials were selected based on their barrier height: silicon dioxide as a high barrier material and zinc sulfide as a low barrier material. PbS quantum wells embedded in different barrier materials were characterized with STS to measure band gap variations. Experimental results showed that the band gap of PbS thin films increased as film thickness decreased and barrier height increased. The experimental results showed good agreement with an effective mass model.
Keywords :
atomic layer deposition; lead compounds; scanning tunnelling microscopy; semiconductor thin films; PbS; atomic layer deposition; band gap variations; barrier height; barrier materials; conformal coating; film thickness; lead sulfide thin films; pinhole-free films; quantum confinement effects; quantum well structures; scanning tunneling microscopy; silicon dioxide; thickness control; zinc sulfide; Atomic layer deposition; Lead; Microscopy; Photonic band gap; Potential well; Sociotechnical systems; Spectroscopy; Thickness control; Transistors; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2009.5411631
Filename :
5411631
Link To Document :
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