• DocumentCode
    3447309
  • Title

    Core losses under DC bias condition based on Steinmetz parameters

  • Author

    Muhlethaler, J. ; Biela, J. ; Kolar, J.W. ; Ecklebe, A.

  • Author_Institution
    Power Electron. Syst. Lab., ETH Zurich, Zurich, Switzerland
  • fYear
    2010
  • fDate
    21-24 June 2010
  • Firstpage
    2430
  • Lastpage
    2437
  • Abstract
    When designing inductive components, calculating core losses is a difficult and not yet entirely solved problem. In particular it is impossible to predict the influence of a DC premagnetization on the losses without performing extensive measurements. For this work, different materials have been tested to gain information how core losses are influenced by a premagnetization. Measurements on molypermalloy powder, silicon steel, nanocrystalline material, and ferrite cores have been performed. Of the tested materials, a premagnetization mainly influences losses in ferrites and nanocrystalline materials, whereas the influence of a premagnetization in molypermalloy powder cores, and cores of silicon steel is negligible. The Steinmetz Premag-netization Graph (SPG) that shows the dependency of the Steinmetz parameters (α, β and k) on premagnetization is introduced. This permits the calculation of core losses under DC bias conditions. Such graphs are given for different materials and different operating temperatures. In addition, a detailed description of the test system is given, as high accuracy is crucial.
  • Keywords
    Permalloy; graph theory; magnetic cores; nanostructured materials; DC premagnetization; Steinmetz premagnetization graph; core losses; ferrite cores; molypermalloy powder; molypermalloy powder cores; nanocrystalline material; silicon steel; Building materials; Core loss; Ferrites; Loss measurement; Materials testing; Nanostructured materials; Performance evaluation; Powders; Silicon; Steel; Core losses; DC bias; Steinmetz; ferrite;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Conference (IPEC), 2010 International
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4244-5394-8
  • Type

    conf

  • DOI
    10.1109/IPEC.2010.5542385
  • Filename
    5542385