Title :
A first approach on the failure mechanisms of IGBT inverters for aeronautical applications: Effect of humidity-pressure combination
Author :
Abbad, H. ; Azzopardi, S. ; Woirgard, E. ; Deletage, J.Y. ; Rollin, P. ; Marchand, K. ; Lhommeau, T. ; Piton, M.
Author_Institution :
Lab. IMS, Univ. de Bordeaux, Talence, France
Abstract :
Comparing to the most common reliability tests this work presents a new approach of accelerated testing, by combining temperature, humidity and pressure cycling with voltage stress. A design of experiments methodology has been proposed to test IGBT inverters and understand environmental factors effect. The humidity-pressure combination effect is studied for various IGBT inverter packaging materials.
Keywords :
avionics; circuit reliability; circuit testing; design of experiments; electronics packaging; insulated gate bipolar transistors; invertors; life testing; space vehicle electronics; IGBT inverter packaging materials; accelerated testing; aeronautical applications; design of experiment methodology; environmental factors; failure mechanisms; humidity-pressure combination; pressure cycling; reliability tests; voltage stress; Design methodology; Failure analysis; Humidity; Insulated gate bipolar transistors; Inverters; Life estimation; Stress; Temperature; Testing; Voltage; IGBT; Reliability; design of experiments; failure mechanisms; multiphysics simulation;
Conference_Titel :
Power Electronics Conference (IPEC), 2010 International
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-5394-8
DOI :
10.1109/IPEC.2010.5542388
