Title :
Sampling Capabilities of a DMM - Determination of Key Parameters
Author :
Hlupic, N. ; Butorac, J.
Author_Institution :
Fac. of Elecrical Eng. & Comput., Zagreb
Abstract :
A sampling method for indirect measurement of all relevant parameters of sampling device is presented. One can determine sampling frequency inaccuracy, integration interval inaccuracy and latency time. All these parameters can be determined with relative error less than 10 ppm, except latency time whose absolute accuracy is about 60 ns
Keywords :
digital multimeters; measurement uncertainty; sampling methods; DMM; absolute accuracy; indirect measurement; integration interval inaccuracy; latency time; sampling capabilities; sampling frequency inaccuracy; Circuits; Delay effects; Frequency; Instruments; Joining processes; Laboratories; Mirrors; Production facilities; Sampling methods; Time measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305617
