DocumentCode :
3447517
Title :
Numerical computations and measurements on calculable resistance standards based on NiCr thin film
Author :
Bounouh, A.
Author_Institution :
BNM-LNE, Trappes
fYear :
2004
fDate :
38139
Firstpage :
370
Lastpage :
371
Abstract :
Coaxial AC resistance standards based on a metallic thin film of NiCr deposited on a short stick of ceramic have been developed at BNM-LNE (Caizergues, 1993). Resistors of 1 kOmega and 10 kOmega nominal values have been constructed. Comparisons with a straight wire resistor of Haddad type allow to evaluate their frequency performances otherwise determined by numerical computations using Flux3D finite elements analysis software
Keywords :
electric resistance measurement; finite element analysis; measurement standards; nickel compounds; thin film inductors; 1 kohm; 10 kohm; Flux3D; Haddad type; NiCr; NiCr thin film; calculable resistance standards; coaxial AC resistance standards; finite elements analysis; frequency performances; numerical computations; numerical measurements; straight wire resistor; Ceramics; Coaxial components; Electrical resistance measurement; Frequency; Measurement standards; Resistors; Sputtering; Standards development; Transistors; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
Type :
conf
DOI :
10.1109/CPEM.2004.305619
Filename :
4097274
Link To Document :
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