DocumentCode :
3447521
Title :
Application of fractional-order differentials in enhancing vestige images of crime scene
Author :
Gang Wang ; Jiliu Zhou ; Zhuzhong Yang ; Xingchun Yang
Author_Institution :
Coll. of Comput. Sci., Sichuan Univ., Chengdu, China
Volume :
1
fYear :
2011
fDate :
20-22 Aug. 2011
Firstpage :
295
Lastpage :
298
Abstract :
After their criminal acts, crime offenders generally leave vestige evidences on the crime scene. To deal with the blurred fingerprints collected from the crime scene, this paper proposes an approach of the 7*7 Fractional Order Differential (FOD) cover operator. Through comparing the enhanced effects of such different differentials order, the paper proves that, this image enhancement approach based on FOD cover operator can significantly enhances the true features of the fingerprint image, instead of adding any pseudo features. It overcomes the distortion incurred the original fingerprints processed by traditional image processing software. As indicated in our experiment results, we compare the enhanced effect of fingerprints with Butterworth high pass filter, and find it easy to obtain natural features of the fingerprint, without evident noise of fingerprint images. The fingerprint image processed by this approach reveals a number of advantages such as higher definition and better applicability.
Keywords :
Butterworth filters; criminal law; fingerprint identification; high-pass filters; image enhancement; 7*7 fractional order differential cover operator; Butterworth high pass filter; blurred fingerprints; crime scene; fingerprint processing; fractional-order differential; image processing software; vestige image enhancement; Digital images; Educational institutions; Equations; Fingerprint recognition; Image matching; Image resolution; Noise; Cover Operator; Criminal Investigation Technology; Effects Compared; Fractional-Order Differential; Image Enhancement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology and Artificial Intelligence Conference (ITAIC), 2011 6th IEEE Joint International
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-8622-9
Type :
conf
DOI :
10.1109/ITAIC.2011.6030209
Filename :
6030209
Link To Document :
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