DocumentCode :
3447751
Title :
Realizing S-Reliability for services via recovery-driven intrusion tolerance mechanism
Author :
Nguyen, Quyen ; Sood, Arun
Author_Institution :
Dept. of Comput. Sci., George Mason Univ., Fairfax, VA, USA
fYear :
2010
fDate :
June 28 2010-July 1 2010
Firstpage :
176
Lastpage :
181
Abstract :
Service-Oriented Architecture (SOA) paradigm facilitates the design of large systems as a set of loosely coupled services interacting with each other. These services, in turn, can be combined to form a more complex service. But, for services to be useful, they must satisfy non-functional requirements, especially security-related quality of service. Unfortunately, software vulnerabilities expose these services to malicious actors, and make them susceptible to attacks. Therefore, security quality of service is critical in order to ensure confidentiality, integrity, and availability for system data and services. Due to the distributed and decentralized nature of services, publishing and guaranteeing security quality of service are crucial so that potential applications and clients can make use of the provided services. In this paper, we will first discuss how Intrusion Tolerance Quality of Service (IT-QoS) can be modeled and specified. Then, we will show how a recovery-driven intrusion tolerance architecture is able to ensure differentiated levels of S-Reliability, an important IT-QoS for a Service.
Keywords :
quality of service; reliability; security of data; software architecture; system recovery; S-reliability; nonfunctional requirements; recovery driven intrusion tolerance mechanism; security related quality of service; service oriented architecture; software vulnerabilities; Availability; Computer architecture; Conferences; Data security; Database systems; Information security; Publishing; Quality of service; Service oriented architecture; Terminology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Systems and Networks Workshops (DSN-W), 2010 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7729-6
Electronic_ISBN :
978-1-4244-7728-9
Type :
conf
DOI :
10.1109/DSNW.2010.5542599
Filename :
5542599
Link To Document :
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