Title :
Characterisation of Magnetic Force Microscope Probes for Quantitative Magnetic Field Mapping at Sub-Micron Length Scales
Author :
Hall, Michael ; Ashcroft, Gwyn
Author_Institution :
National Phys. Lab.
Abstract :
Magnetic force microscopy is a special mode of atomic force microscopy that can be used to image magnetic features. For the image contrast to be quantitative the tip of the scanning probe needs to be characterised. Methods for achieving this are being developed and the principles behind them are presented here
Keywords :
atomic force microscopy; magnetic field measurement; magnetic force microscopy; probes; atomic force microscopy; image contrast; magnetic force microscope probes; magnetic force microscopy; quantitative magnetic field; Atomic force microscopy; Magnetic domain walls; Magnetic domains; Magnetic fields; Magnetic force microscopy; Magnetic forces; Magnetic materials; Magnetization; Probes; Scanning electron microscopy;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305276
