DocumentCode
3447773
Title
Characterisation of Magnetic Force Microscope Probes for Quantitative Magnetic Field Mapping at Sub-Micron Length Scales
Author
Hall, Michael ; Ashcroft, Gwyn
Author_Institution
National Phys. Lab.
fYear
2004
fDate
38139
Firstpage
398
Lastpage
399
Abstract
Magnetic force microscopy is a special mode of atomic force microscopy that can be used to image magnetic features. For the image contrast to be quantitative the tip of the scanning probe needs to be characterised. Methods for achieving this are being developed and the principles behind them are presented here
Keywords
atomic force microscopy; magnetic field measurement; magnetic force microscopy; probes; atomic force microscopy; image contrast; magnetic force microscope probes; magnetic force microscopy; quantitative magnetic field; Atomic force microscopy; Magnetic domain walls; Magnetic domains; Magnetic fields; Magnetic force microscopy; Magnetic forces; Magnetic materials; Magnetization; Probes; Scanning electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location
London
Print_ISBN
0-7803-8494-6
Electronic_ISBN
0-7803-8494-6
Type
conf
DOI
10.1109/CPEM.2004.305276
Filename
4097288
Link To Document