Title :
Verification of soft error detection mechanism through fault injection on hardware emulation platform
Author :
Bailan, O. ; Rossi, Umberto ; Wantens, Anne ; Daveau, Jean-Marc ; Nappi, Salvatore ; Roche, Philippe
Author_Institution :
STMicroelectronics, Agrate Brianza, Italy
fDate :
June 28 2010-July 1 2010
Abstract :
In this paper we describe one of the verification activities performed on a dual core 32-bit System-on-Chip designed for Automotive Safety applications and the consequent implementation of a methodology to verify the functionality of one of the safety mechanisms of the device. The Safety standards recommend the usage of fault-injection techniques to give evidence of the failure robustness of the electronic devices designed for Functional Safety. In this case we verified the robustness of the SoC processing subsystem to the Single Event Upset through the usage of some hardware emulation platforms where the device RTL was mapped, properly instrumented to allow the modification of Flip-Flop status during application runtime, thus modeling the SEUs effects. The main novelty of our work is therefore the definition of a methodology to verify the robustness of a SoC to SEUs; additionally we show that the same methodology can be used also to perform thorough measurements of the SER masking effect on a System on Chip.
Keywords :
error detection; flip-flops; logic design; system-on-chip; SoC processing; dual core 32-bit system-on-chip; fault injection; flip-flop status; hardware emulation platform; safety standard; soft error detection mechanism; word length 32 bit; Automotive engineering; Emulation; Fault detection; Hardware; Instruments; Robustness; Safety devices; Single event transient; Single event upset; System-on-a-chip; Failure in Time (FIT); Fault Collection Control Unit (FCCU); Fault Injection; Functional Safety; Redundancy Checker Control Unit (RCCU); Single Event Upset (SEU); Soft Error Rate (SER); Soft Errors; Sphere of Replication (SoR);
Conference_Titel :
Dependable Systems and Networks Workshops (DSN-W), 2010 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7729-6
Electronic_ISBN :
978-1-4244-7728-9
DOI :
10.1109/DSNW.2010.5542611