Systematic Errors in Noise Parameter Determination Due to Imperfect Source Impedance Measurement

Author

Wiatr, W. ; Walker, D.

Author_Institution

Warsaw Univ. of Technol.

fYear

2004

fDate

38139

Firstpage

416

Lastpage

417

Abstract

The paper presents a rigorous analysis of systematic errors in the four-noise parameter determination of a two-port network using the cold-source technique. The method is based on an original model that accounts for imperfectly-measured source reflection coefficients due to residual errors within a vector network analyzer (VNA). The authors show that even small VNA errors may seriously deteriorate the accuracy of the noise parameters when characterizing low-noise pseudomorphic high-electron mobility transistors (PHEMTs)

Keywords

electric noise measurement; high electron mobility transistors; measurement errors; network analysers; two-port networks; cold-source technique; imperfect source impedance measurement; noise parameter determination; pseudomorphic high electron mobility transistors; source reflection coefficients; systematic errors; two-port network; vector network analyzer; Acoustic reflection; Calibration; Error analysis; Impedance measurement; Measurement errors; Measurement standards; Noise measurement; PHEMTs; Power system modeling; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 2004 Conference on

Conference_Location

London

Print_ISBN

0-7803-8494-6

Electronic_ISBN

0-7803-8494-6

Type

conf

DOI

10.1109/CPEM.2004.305285

Filename

4097297