Title :
Measurement Uncertainty Reduction in a Mini TEM Cell
Author :
Teunisse, G.M. ; de Vreede, J.P.M.
Author_Institution :
NMi Van Swinden Laboratorium, Delft
Abstract :
A method for a mathematical reduction of the dominant uncertainty contribution in a mini TEM cell, caused by reflections in the transition sections, is discussed. A unique measurement method is developed for the validation of the mathematical assumptions
Keywords :
TEM cells; calibration; electromagnetic fields; instruments; measurement uncertainty; mathematical reduction; measurement method; measurement uncertainty; mini TEM cell; transverse electromagnetic cell; Calibration; Frequency response; Impedance; Laboratories; Measurement uncertainty; Performance evaluation; Power generation; Probes; Reflection; TEM cells;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305286
