Title :
Frequency Measurements of 778 nm Rubidium Two Photon Diode Laser Standards
Author :
Edwards, C.S. ; Margolis, H.S. ; Barwood, G.P. ; Gill, P. ; Rowley, W.R.C.
Author_Institution :
National Phys. Lab., Teddington
Abstract :
A pair of 778 nm rubidium two photon diode laser frequency standards has been developed at NPL. Their systematic sensitivity to various experimental parameters has been investigated and their stability and reproducibility characterized. Absolute frequency measurements have been made for two hyperfine components
Keywords :
frequency standards; rubidium; semiconductor lasers; 778 nm; Rb; frequency measurements; hyperfine components; systematic sensitivity; two photon diode laser; Diode lasers; Frequency measurement; Laboratories; Laser stability; Measurement standards; Photodiodes; Power generation; Reproducibility of results; Standards development; Ultrafast optics;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305288
