DocumentCode
3448038
Title
Frequency Measurements of 778 nm Rubidium Two Photon Diode Laser Standards
Author
Edwards, C.S. ; Margolis, H.S. ; Barwood, G.P. ; Gill, P. ; Rowley, W.R.C.
Author_Institution
National Phys. Lab., Teddington
fYear
2004
fDate
38139
Firstpage
422
Lastpage
423
Abstract
A pair of 778 nm rubidium two photon diode laser frequency standards has been developed at NPL. Their systematic sensitivity to various experimental parameters has been investigated and their stability and reproducibility characterized. Absolute frequency measurements have been made for two hyperfine components
Keywords
frequency standards; rubidium; semiconductor lasers; 778 nm; Rb; frequency measurements; hyperfine components; systematic sensitivity; two photon diode laser; Diode lasers; Frequency measurement; Laboratories; Laser stability; Measurement standards; Photodiodes; Power generation; Reproducibility of results; Standards development; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location
London
Print_ISBN
0-7803-8494-6
Electronic_ISBN
0-7803-8494-6
Type
conf
DOI
10.1109/CPEM.2004.305288
Filename
4097300
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