DocumentCode :
3448067
Title :
Evaluation of electrical material properties: Embedment stress testing on electrical encapsulation resins
Author :
Melick, D.J. ; Browning, D. ; Shelton, K.
Author_Institution :
Elf Atochem North America, Inc., Philadelphia, PA, USA
fYear :
1993
fDate :
4-7 Oct 1993
Firstpage :
639
Lastpage :
641
Abstract :
The embedment stress of a variety of encapsulation resins including HTPB (hydroxyl terminated polybutadiene) based polyurethanes, epoxies, and silicone is addressed. The embedment stress method followed is ASTM F135-76. The test determines the embedment stress of a rigid system with a peak cure exotherm under 200° F. The data reflect the stress exerted on a glass encased encapsulated component by measuring the stress exerted on a glass encased encapsulated component by measuring the stress exerted on a thermometer bulb below the peak exotherm of the system. In this test, a thermometer and a thermocouple are embedded in the various encapsulation systems. The test samples are subjected to a range of temperatures. Temperature readings are taken from both the thermometer and thermocouple. The relative embedment stress is calculated from the differences between the two temperature readings
Keywords :
organic insulating materials; ASTM F135-76; breakdown; electrical encapsulation resins; embedment stress; epoxy resins; glass encased encapsulated component; hydroxyl terminated polybutadiene; peak cure exotherm; polyurethanes; silicone; stress measurement; testing; thermocouple; thermometer bulb; Encapsulation; Glass; Material properties; Materials testing; Petroleum; Protection; Resins; System testing; Temperature distribution; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Electronics Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 1993. Proceedings., Chicago '93 EEIC/ICWA Exposition
Conference_Location :
Chicago, IL
ISSN :
1071-6270
Print_ISBN :
0-7803-0847-6
Type :
conf
DOI :
10.1109/EEIC.1993.631302
Filename :
631302
Link To Document :
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