DocumentCode :
3448246
Title :
Design of Totally Self-Checking Sequential Circuits
Author :
Greblicki, Jerzy W. ; Kotowski, Jerzy
Author_Institution :
Control & Robot., Wroclaw Univ. of Technol., Wroclaw, Poland
fYear :
2009
fDate :
10-12 Sept. 2009
Firstpage :
1
Lastpage :
6
Abstract :
Methods of designing of totally self checking sequential machines are presented in this paper. The main problem in TSC sequential machines (TSC SM) designing is synthesis TSC functional excitation circuit. Formal condition of self testing (ST) property for AND-OR structures are given. New method of circuit minimization is presented and ST of minimized circuits is proofed. We also present a methodology of designing of TSC SM. Owing to our methods we can design TSC circuits in a fully automatic way.
Keywords :
VLSI; automatic testing; circuit optimisation; logic design; sequential circuits; sequential machines; AND-OR structures; circuit minimization; sequential circuits; totally self checking sequential machines; Aerospace safety; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Design methodology; Electrical fault detection; Fault detection; Samarium; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Logistics and Industrial Informatics, 2009. LINDI 2009. 2nd International
Conference_Location :
Linz
Print_ISBN :
978-1-4244-3958-4
Electronic_ISBN :
978-1-4244-3958-4
Type :
conf
DOI :
10.1109/LINDI.2009.5258681
Filename :
5258681
Link To Document :
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