• DocumentCode
    3448322
  • Title

    The structural evolution of CGS thin film during three-stage deposition process

  • Author

    Al-Thani, H.A. ; Hasoon, F.S.

  • Author_Institution
    Nat. Energy & Water Res. Center, Abu Dhabi, United Arab Emirates
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    CGS thin films were deposited on Molybdenum coated soda lime glass (Mo/SLG) substrates, using physical vapor deposition (PVD) 3-stage process. In order to study the evolution of the CGS growth process and the Na out-diffusion in the CGS films from SLG substrates, the structural phase transitions were traced in the CGS films indicated by multiple exothermic reactions that occur during the growth process. The CGS films´ structure was examined and the films´ growth phase was identified by applying ¿/2¿ X-Ray Diffraction characterization technique. Secondary-ion mass spectrometry (SIMS) was also applied to depth profile the Na in the CGS/Mo/SLG films.
  • Keywords
    X-ray diffraction; copper compounds; diffusion; gallium compounds; secondary ion mass spectra; semiconductor growth; semiconductor thin films; solid-state phase transformations; ternary semiconductors; vacuum deposited coatings; vacuum deposition; CuGaSe3; Mo-Na2O-CaO-SiO2; Na2O-CaO-SiO2; X-ray diffraction; multiple exothermic reactions; out-diffusion; physical vapor deposition; secondary-ion mass spectrometry; structural evolution; structural phase transitions; thin films; Atherosclerosis; Chemical vapor deposition; Glass; Laboratories; Photonic band gap; Renewable energy resources; Sputtering; Substrates; Temperature; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411677
  • Filename
    5411677