DocumentCode
3448450
Title
Using finite element methods and 3D image correlation to model solar cell bowing
Author
Coulter, William H. ; Czyzewicz, Robin C. ; Farneth, William E. ; Prince, Alistair ; Rajendran, Raj G.
Author_Institution
DuPont Eng., Wilmington, DE, USA
fYear
2009
fDate
7-12 June 2009
Abstract
Previous efforts aimed at modeling solar cell bowing due to the aluminum back surface field (BSF) have focused on relatively simple two or three layer models. This paper will outline the effort to develop a more sophisticated finite element (FE) model approach. This approach is superior to previous modeling efforts since it allows a more accurate representation of the cell structure and can handle complex geometry like the front surface grid and silver bus bars. The first section of the paper will highlight previous modeling efforts touching on the strengths and weaknesses of the various approaches. The second section focuses on the unique measurement techniques used to quantify actual solar cell bowing. The final section of the paper will concentrate on the model details and the use of the model to gain insight into how the various layer thicknesses (silicon, eutectic, aluminum, etc.) and cell geometry impact cell bowing.
Keywords
bending; finite element analysis; solar cells; 3D image correlation; back surface field; finite element method; finite element model; layer thickness; solar cell bowing; Conductive films; Conductivity; Finite element methods; Glass; Inductors; Large-scale systems; Photovoltaic cells; Plasma applications; Research and development; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location
Philadelphia, PA
ISSN
0160-8371
Print_ISBN
978-1-4244-2949-3
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2009.5411682
Filename
5411682
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