• DocumentCode
    3448450
  • Title

    Using finite element methods and 3D image correlation to model solar cell bowing

  • Author

    Coulter, William H. ; Czyzewicz, Robin C. ; Farneth, William E. ; Prince, Alistair ; Rajendran, Raj G.

  • Author_Institution
    DuPont Eng., Wilmington, DE, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    Previous efforts aimed at modeling solar cell bowing due to the aluminum back surface field (BSF) have focused on relatively simple two or three layer models. This paper will outline the effort to develop a more sophisticated finite element (FE) model approach. This approach is superior to previous modeling efforts since it allows a more accurate representation of the cell structure and can handle complex geometry like the front surface grid and silver bus bars. The first section of the paper will highlight previous modeling efforts touching on the strengths and weaknesses of the various approaches. The second section focuses on the unique measurement techniques used to quantify actual solar cell bowing. The final section of the paper will concentrate on the model details and the use of the model to gain insight into how the various layer thicknesses (silicon, eutectic, aluminum, etc.) and cell geometry impact cell bowing.
  • Keywords
    bending; finite element analysis; solar cells; 3D image correlation; back surface field; finite element method; finite element model; layer thickness; solar cell bowing; Conductive films; Conductivity; Finite element methods; Glass; Inductors; Large-scale systems; Photovoltaic cells; Plasma applications; Research and development; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411682
  • Filename
    5411682