Title :
Progress on the Quantum Capacitance Standard at Metas
Author :
Hof, C. ; Jeanneret, B. ; Eichenberger, A.L. ; Overney, F. ; Lotkhov, S.
Author_Institution :
Swiss Fed. Office of Metrol. & Accreditation, METAS, Bem-Wabem
Abstract :
At the Swiss Federal Office of Metrology and Accreditation (METAS) a quantum primary standard of capacitance based on single electron tunneling devices is under development. In this paper we report on the progress made so far as well as on the current work towards the realization of this standard
Keywords :
capacitance measurement; measurement standards; single electron devices; tunnelling; quantum capacitance standard; single electron tunneling devices; Accreditation; Current measurement; Electrons; Metrology; NIST; Quantum capacitance; Stability; Temperature; Tunneling; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305354
