DocumentCode
3449321
Title
Optimal extraction-a generalized least-squares approach
Author
Tudor, Bogdan ; Steriu, Mihai-Dan
Author_Institution
Politehnic Univ. of Bucharest, Romania
fYear
1995
fDate
11-14 Oct 1995
Firstpage
69
Lastpage
72
Abstract
This paper presents an original study on the applicability of the generalized least-squares method in electron device parameter extraction. A comparison, done by using real and simulated data, proves that by applying the generalized method together with an appropriate weighting model one can obtain better parameter deviations, compared to the conventional least-squares method
Keywords
Monte Carlo methods; least squares approximations; semiconductor device models; Monte Carlo methods; electron device parameter extraction; generalized least-squares approach; optimal extraction; parameter deviations; simulated data; weighting model; Covariance matrix; Data mining; Electron devices; Equations; Measurement errors; Measurement standards; Minimization methods; Parameter estimation; Q measurement; Shape measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1995. CAS'95 Proceedings., 1995 International
Conference_Location
Sinaia
Print_ISBN
0-7803-2647-4
Type
conf
DOI
10.1109/SMICND.1995.494866
Filename
494866
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