DocumentCode
3449376
Title
Single-shot characterization of high-energy short optical pulses at 1.05 micron using spectral phase interferometry for direct electric-fleld reconstruction
Author
Dorrer, C. ; Walmsley, Ian A. ; Le Blanc, C. ; Wattellier, Benoit ; Migus, A.
Author_Institution
Inst. of Opt., Rochester Univ., NY, USA
fYear
2001
fDate
11-11 May 2001
Firstpage
274
Lastpage
275
Abstract
Summary form only given. The characterization of ultrashort optical pulses is a useful tool for the optimization of chirped pulse amplification systems. The quality of the output pulse depends on many parameters, including the compensation of dispersion, nonlinear effects, and gain narrowing. Large systems now deliver pulses with peak powers in the 100 TW to1 PW range, but this is useless if the pulse shape is not optimal. The characterization device must be single shot, because of shot-to-shot discrepancies, mostly insensitive to the beam profile, able of working in real-time for optimization, and of course able of providing accurate results. Spectral phase interferometry for direct electric-field reconstruction (SPIDER) matches all these constraints. We have implemented SPIDER on a 100 TW laser system (30 Joules, 300 fs) operating around 1 micron.
Keywords
chirp modulation; compensation; laser variables measurement; light interferometry; optical frequency conversion; optical modulation; optical pulse compression; solid lasers; spectroscopy; 100 TW; 100 TW to 1 PW; 30 J; 300 fs; TW laser system; beam profile; chirped pulse amplification systems; dispersion compensation; gain narrowing; high-energy short optical pulses; nonlinear effects; pulse shape; real-time; single-shot characterization; spectral phase interferometry for direct electric field reconstruction; Dispersion; Interference; Optical attenuators; Optical distortion; Optical interferometry; Optical pulses; Oscillators; Pulse amplifiers; Stimulated emission; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-662-1
Type
conf
DOI
10.1109/CLEO.2001.947796
Filename
947796
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