Title : 
Investigations of sodium in bridgman-grown CuInSe2
         
        
            Author : 
Champness, C.H. ; Myers, H.F. ; Shih, I.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
         
        
        
        
            Abstract : 
Measurements of thermoelectric power (¿) and electrical resistivity (¿) were made at room temperature on filamentary samples of CuInSe2 (stoichiometric) and CuInSe2.2 (excess Se), Bridgman-grown with added elemental sodium in the melt in the amounts of 0, 0.1, 0.2, 0.5, 1, 2 and 3 at. %. In the CuInSe2 + Na samples, conversion from p- to n-type occurred between 0.2 and 0.5 at. % Na, yielding electron concentrations of the order of 1016 cm-3. By contrast, the CuInSe2.2 + Na samples remained p-type at all the sodium addition levels, yielding hole concentrations of the order of 1018 cm-3. In the important range 0 to 0.5 at. % Na, where sample brittleness is less of a problem than for higher additions, no major changes occurred in hole mobility or resistivity but a small increase in ¿p and a small decrease in ¿ was apparent at 0.1 at. % Na.
         
        
            Keywords : 
copper compounds; crystal growth from melt; electrical resistivity; indium compounds; sodium; solar cells; thermoelectric power; Bridgman-grown CuInSe2; CuInSe2; Na; electrical resistivity; electron concentrations; elemental sodium; filamentary samples; hole concentrations; sodium addition levels; thermoelectric power; Conductivity; Copper; Crystals; Electric resistance; Electric variables measurement; Grain boundaries; Photovoltaic cells; Power measurement; Temperature; Thermoelectricity;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
         
        
            Conference_Location : 
Philadelphia, PA
         
        
        
            Print_ISBN : 
978-1-4244-2949-3
         
        
            Electronic_ISBN : 
0160-8371
         
        
        
            DOI : 
10.1109/PVSC.2009.5411744