DocumentCode
3449648
Title
Using Blind Identification in the Dynamic Characterization of High Voltage Oscilloscope Probes
Author
Martínez, S. ; Martínez, J.
Author_Institution
Electr. Eng. Dept., Univ. Politecnica de Madrid
fYear
2004
fDate
38139
Firstpage
577
Lastpage
578
Abstract
The use of a blind identification technique for the characterization of the dynamic performance of oscilloscope and waveform recorder probes used in high voltage measurements is described. The procedure allows the intercomparison of reference systems for calibration at the highest accuracy
Keywords
blind source separation; calibration; oscilloscopes; probes; voltage measurement; waveform generators; blind identification technique; high voltage measurements; high voltage oscilloscope probes; oscilloscope dynamic performance; waveform recorder probes; Bandwidth; Calibration; Circuit testing; Instruments; Oscilloscopes; Probes; Pulse measurements; Signal generators; System testing; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location
London
Print_ISBN
0-7803-8494-6
Electronic_ISBN
0-7803-8494-6
Type
conf
DOI
10.1109/CPEM.2004.305387
Filename
4097381
Link To Document