Title :
Using Blind Identification in the Dynamic Characterization of High Voltage Oscilloscope Probes
Author :
Martínez, S. ; Martínez, J.
Author_Institution :
Electr. Eng. Dept., Univ. Politecnica de Madrid
Abstract :
The use of a blind identification technique for the characterization of the dynamic performance of oscilloscope and waveform recorder probes used in high voltage measurements is described. The procedure allows the intercomparison of reference systems for calibration at the highest accuracy
Keywords :
blind source separation; calibration; oscilloscopes; probes; voltage measurement; waveform generators; blind identification technique; high voltage measurements; high voltage oscilloscope probes; oscilloscope dynamic performance; waveform recorder probes; Bandwidth; Calibration; Circuit testing; Instruments; Oscilloscopes; Probes; Pulse measurements; Signal generators; System testing; Voltage measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305387
