• DocumentCode
    3449676
  • Title

    Approximation algorithms for classification problems with pairwise relationships: metric labeling and Markov random fields

  • Author

    Kleinberg, Jon ; Tardos, Éva

  • Author_Institution
    Dept. of Comput. Sci., Cornell Univ., Ithaca, NY, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    14
  • Lastpage
    23
  • Abstract
    In a traditional classification problem, we wish to assign one of k labels (or classes) to each of n objects, in a way that is consistent with some observed data that we have about the problem. An active line of research in this area is concerned with classification when one has information about pairwise relationships among the objects to be classified; this issue is one of the principal motivations for the framework of Markov random fields, and it arises in areas such as image processing, biometry: and document analysis. In its most basic form, this style of analysis seeks a classification that optimizes a combinatorial function consisting of assignment costs-based on the individual choice of label we make for each object-and separation costs-based on the pair of choices we make for two “related” objects. We formulate a general classification problem of this type, the metric labeling problem; we show that it contains as special cases a number of standard classification frameworks, including several arising from the theory of Markov random fields. From the perspective of combinatorial optimization, our problem can be viewed as a substantial generalization of the multiway cut problem, and equivalent to a type of uncapacitated quadratic assignment problem. We provide the first non-trivial polynomial-time approximation algorithms for a general family of classification problems of this type. Our main result is an O(log k log log k)-approximation algorithm for the metric labeling problem, with respect to an arbitrary metric on a set of k labels, and an arbitrary weighted graph of relationships on a set of objects. For the special case in which the labels are endowed with the uniform metric-all distances are the same-our methods provide a 2-approximation
  • Keywords
    Markov processes; pattern classification; Markov random fields; classification problem; combinatorial optimization; metric labeling; multiway cut problem; pairwise relationships; uncapacitated quadratic assignment problem; Approximation algorithms; Classification algorithms; Computer science; Cost function; Electrical capacitance tomography; Image analysis; Image processing; Labeling; Markov random fields; Read only memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Foundations of Computer Science, 1999. 40th Annual Symposium on
  • Conference_Location
    New York City, NY
  • ISSN
    0272-5428
  • Print_ISBN
    0-7695-0409-4
  • Type

    conf

  • DOI
    10.1109/SFFCS.1999.814572
  • Filename
    814572