DocumentCode :
3449687
Title :
The ALU+ concept: N-type silicon solar cells with surface-passivated screen-printed aluminum-alloyed rear emitter
Author :
Bock, Robert ; Schmidt, Jan ; Mau, Susanne ; Hoex, Bram ; Kessels, Erwin ; Brende, Rolf
Author_Institution :
Inst. fur Solarenergieforschung Hameln (ISFH), Emmerthal, Germany
fYear :
2009
fDate :
7-12 June 2009
Abstract :
Aluminum-doped p-type (Al-p+) silicon emitters fabricated by means of screen-printing and firing are effectively passivated by plasma-enhanced chemical-vapor deposited (PECVD) amorphous silicon (a-Si) and atomic-layer-deposited (ALD) aluminum oxide (Al2O3) as well as Al2O3/SiNx stacks, where the silicon nitride (SiNx) layer is deposited by PECVD. While the a-Si passivation of the Al-p+ emitter results in an emitter saturation current density J0e of 246 fA/cm2, the Al2O3/SiNx double layers result in emitter saturation current densities as low as 160 fA/cm2, which is the lowest J0e reported so far for screen-printed Al-doped p+ emitters. Moreover, the Al2O3 as well as the Al2O3/SiNx stacks show an excellent stability during firing in a conveyor belt furnace at 900°C. We implement our newly developed passivated Al-p+ emitter into an n+np+ solar cell structure, the so-called ALU+ cell. An independently confirmed conversion efficiency of 20% is achieved on an aperture cell area of 4 cm2, clearly demonstrating the high-efficiency potential of our ALU+ cell concept.
Keywords :
aluminium; aluminium compounds; amorphous semiconductors; current density; elemental semiconductors; firing (materials); passivation; plasma CVD; semiconductor growth; silicon; silicon compounds; solar cells; ALU+ concept; N-type silicon solar cells; PECVD; Si:Al-Al2O3-SiNx; aluminum-doped p-type silicon emitters; amorphous silicon; aperture cell area; atomic-layer-deposited aluminum oxide; conversion efficiency; conveyor belt furnace; emitter saturation current density; firing; plasma-enhanced chemical-vapor deposition; screen-printed aluminum-alloyed rear emitter; silicon nitride layer; surface-passivated aluminum-alloyed rear emitter; temperature 900 degC; Aluminum oxide; Amorphous silicon; Atomic layer deposition; Chemicals; Current density; Passivation; Plasma chemistry; Plasma displays; Silicon compounds; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2009.5411768
Filename :
5411768
Link To Document :
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