DocumentCode :
3449745
Title :
New contrasts in the topographs of quartz obtained with the third generation synchrotron
Author :
Capelle, B. ; Detaint, J. ; Zarka, A. ; Epelboin, Y.
Author_Institution :
LMCP, Paris VII Univ., France
fYear :
1998
fDate :
27-29 May 1998
Firstpage :
816
Lastpage :
822
Abstract :
The synchrotron radiation delivered by the topography beam line of the European Synchrotron Radiation Facility (ESRF) was used to study quartz crystals and resonators. Several experimental set-ups taking advantage of the unique properties of the beam (very small divergence, extended spectra, time structure, etc.) were used to enhance the sensibility of detection of strain gradients due either to defects or to vibration modes. New contrasts were observed at the limits of the Z growth sectors (and also in the X or 8 sectors) in the most perfect crystals obtained by the crossed growth technique. In several samples of synthetic quartz, we have observed in the Z growth region, contrasts normal to the growth direction and resembling those of stacking faults. The increase of the sensibility of the stroboscopic technique has allowed to observe an important feature concerning the interaction of the vibration mode with the mounting clips (3rd overtone plano-convex resonator). The experiments and the results obtained are, in their principles, similar to those previously reported (1989) but the new experimental diffraction conditions bring an important increase of the sensibility of detection
Keywords :
X-ray topography; crystal defects; crystal resonators; quartz; strain measurement; surface topography measurement; synchrotron radiation; 3rd overtone piano-convex resonator; European Synchrotron Radiation Facility; SiO2; Z growth sectors; crossed growth technique; defects; mounting clips; quartz crystals; resonators; strain gradients; stroboscopic technique; synchrotron radiation; vibration mode; vibration modes; Capacitive sensors; Crystals; Diffraction; Optical reflection; Stacking; Surfaces; Synchrotron radiation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
Conference_Location :
Pasadena, CA
ISSN :
1075-6787
Print_ISBN :
0-7803-4373-5
Type :
conf
DOI :
10.1109/FREQ.1998.717994
Filename :
717994
Link To Document :
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