• DocumentCode
    3449823
  • Title

    VDMOS modeling for IC CAD

  • Author

    Jiaming Bao ; Haochen Qi ; Jian Zhang ; Yanke Zhang ; Zhiyan Hao

  • Author_Institution
    Dept. of Microelectron., North China Univ. of Technol., Beijing, China
  • Volume
    2
  • fYear
    2011
  • fDate
    20-22 Aug. 2011
  • Firstpage
    245
  • Lastpage
    249
  • Abstract
    The VDMOS physical modeling method is studied, and then a VDMOS physical model is proposed for IC CAD. In this model, for the region whose cross-section area of electron flow is variable, a differential equation for the vertical electric field, which considers the high electric field´s strong influence on the electron mobility, is established. Moreover, when the nonuniform electron concentration distribution is considered, this differential equation is solved by the analytical method. In addition, for the region whose cross-section area of electron flow is invariable, the analytical formula of vertical electric field is derived approximately by proper simplification. The calculation results show that in comparison to the Yeong-seuk Kim et al´s model, the calculation precision of this model is greatly improved. Especially when both the gate voltage and the drain voltage are high, its improvement is remarkable.
  • Keywords
    MOSFET; circuit CAD; differential equations; electric fields; electron mobility; equivalent circuits; semiconductor device models; IC CAD; VDMOS physical modeling method; differential equation; electron flow; electron mobility; nonuniform electron concentration distribution; vertical electric field; Differential equations; Electric fields; Integrated circuit modeling; Logic gates; Mathematical model; Numerical models; Solid modeling; CAD; VDMOS; differential equation; electric field; electron concentration; modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology and Artificial Intelligence Conference (ITAIC), 2011 6th IEEE Joint International
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-8622-9
  • Type

    conf

  • DOI
    10.1109/ITAIC.2011.6030321
  • Filename
    6030321