Title :
Defect engineering investigation with cathodoluminescence in scanning electron microscopy
Author :
Nazarov, M.V. ; Nazarova, T.A.
Author_Institution :
Tech. Univ., Kishinev, Moldova
Abstract :
The behaviour of cathodoluminescence (CL) associated with hardness indents in MgO has been examined. Based on the experimental observations, a model is presented, which relates the movement of the displaced material, the production of the dislocation structures, the defect engineering, the development of the various slip traces and the formation of the cracks
Keywords :
cathodoluminescence; cracks; dislocation structure; hardness; magnesium compounds; materials testing; scanning electron microscopy; slip; MgO; cathodoluminescence; crack formation; defect engineering investigation; dislocation structures; hardness indents; scanning electron microscopy; slip traces; Capacitive sensors; Computer graphics; Crystals; Electron microscopy; Indium tin oxide; Luminescence; Plastics; Scanning electron microscopy; Temperature;
Conference_Titel :
Semiconductor Conference, 1995. CAS'95 Proceedings., 1995 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-2647-4
DOI :
10.1109/SMICND.1995.494892
