DocumentCode
3449833
Title
Defect engineering investigation with cathodoluminescence in scanning electron microscopy
Author
Nazarov, M.V. ; Nazarova, T.A.
Author_Institution
Tech. Univ., Kishinev, Moldova
fYear
1995
fDate
11-14 Oct 1995
Firstpage
179
Lastpage
182
Abstract
The behaviour of cathodoluminescence (CL) associated with hardness indents in MgO has been examined. Based on the experimental observations, a model is presented, which relates the movement of the displaced material, the production of the dislocation structures, the defect engineering, the development of the various slip traces and the formation of the cracks
Keywords
cathodoluminescence; cracks; dislocation structure; hardness; magnesium compounds; materials testing; scanning electron microscopy; slip; MgO; cathodoluminescence; crack formation; defect engineering investigation; dislocation structures; hardness indents; scanning electron microscopy; slip traces; Capacitive sensors; Computer graphics; Crystals; Electron microscopy; Indium tin oxide; Luminescence; Plastics; Scanning electron microscopy; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1995. CAS'95 Proceedings., 1995 International
Conference_Location
Sinaia
Print_ISBN
0-7803-2647-4
Type
conf
DOI
10.1109/SMICND.1995.494892
Filename
494892
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