Title : 
Fast nano-scale texturing using the self-assembly polymer mask and wet chemical etching
         
        
            Author : 
Lin, Ching-Hsi ; Du, Chen-Hsun ; Lan, Chung-Wen
         
        
            Author_Institution : 
Photovoltaics Technol. Center, Ind. Technol. Res. Inst., Hsinchu, Taiwan
         
        
        
        
            Abstract : 
An efficient suppression of reflection in a broad spectral range can be achieved when the textured scale is comparable to the wavelength of incident light. The nano-scale texturing method is, therefore, attracting many interests in many fields. In this study, a fast nano-scale texturing method for the crystalline silicon substrate has been provided. By using the self-assembly polymer mask and wet chemical etching, an almost uniform low reflectance can be achieved. The self-assembly polymer mask was fabricated by coating the pre-prepared polymer solution onto silicon substrate followed by suitable heat treatment. In addition to being technologically easy, the process is also inexpensive.
         
        
            Keywords : 
etching; heat treatment; liquid phase deposited coatings; liquid phase deposition; masks; nanofabrication; nanostructured materials; polymer films; reflectivity; self-assembly; surface texture; Si; heat treatment; incident light wavelength; nanoscale texturing; polymer mask; polymer solution; reflectance; reflection suppression; self-assembly; wet chemical etching; Chemicals; Coatings; Crystallization; Heat treatment; Optical reflection; Polymer films; Reflectivity; Self-assembly; Silicon; Wet etching;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
         
        
            Conference_Location : 
Philadelphia, PA
         
        
        
            Print_ISBN : 
978-1-4244-2949-3
         
        
            Electronic_ISBN : 
0160-8371
         
        
        
            DOI : 
10.1109/PVSC.2009.5411780