Title :
Fast nano-scale texturing using the self-assembly polymer mask and wet chemical etching
Author :
Lin, Ching-Hsi ; Du, Chen-Hsun ; Lan, Chung-Wen
Author_Institution :
Photovoltaics Technol. Center, Ind. Technol. Res. Inst., Hsinchu, Taiwan
Abstract :
An efficient suppression of reflection in a broad spectral range can be achieved when the textured scale is comparable to the wavelength of incident light. The nano-scale texturing method is, therefore, attracting many interests in many fields. In this study, a fast nano-scale texturing method for the crystalline silicon substrate has been provided. By using the self-assembly polymer mask and wet chemical etching, an almost uniform low reflectance can be achieved. The self-assembly polymer mask was fabricated by coating the pre-prepared polymer solution onto silicon substrate followed by suitable heat treatment. In addition to being technologically easy, the process is also inexpensive.
Keywords :
etching; heat treatment; liquid phase deposited coatings; liquid phase deposition; masks; nanofabrication; nanostructured materials; polymer films; reflectivity; self-assembly; surface texture; Si; heat treatment; incident light wavelength; nanoscale texturing; polymer mask; polymer solution; reflectance; reflection suppression; self-assembly; wet chemical etching; Chemicals; Coatings; Crystallization; Heat treatment; Optical reflection; Polymer films; Reflectivity; Self-assembly; Silicon; Wet etching;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2009.5411780