DocumentCode :
3449950
Title :
Ballistic electron microscopy of a metal molecule interface
Author :
Kunardi, Linda ; Yi, Zheng ; Troadec, Cedric ; Lwin, Ma Han Thu ; Knoll, Wolfgang ; Chandrasekhar, N.
Author_Institution :
Institute of Materials Research and Engineering, 3 Research Link, Singapore 117602
fYear :
2006
fDate :
10-13 Jan. 2006
Firstpage :
194
Lastpage :
196
Abstract :
We present studies on a Ag/ HS–(CH2)4–T3–H (T3C4SH)/ Au diode using nanometer scale resolution, ballistic electron emission microscopy (BEEM). Images show spatially non-uniform carrier injection. A WKB calculation is carried out and compared with the experimental data. The results indicate that molecular levels are being accessed in the BEEM experiment, since the measured currents are larger than purely tunneling contribution. Our results are consistent with previously published results on a similar molecule [ 1]. Physical origins of the non-uniform carrier injection and its implications are discussed.
Keywords :
Current measurement; Electron emission; Electron microscopy; Gold; Indium; Physics; Schottky diodes; Silver; Spectroscopy; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies - Nanoelectronics, 2006 IEEE Conference on
Print_ISBN :
0-7803-9357-0
Type :
conf
DOI :
10.1109/NANOEL.2006.1609710
Filename :
1609710
Link To Document :
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