Title :
Calibration of Standard Capacitors of 0.01 - 1 μF at NMIJ/AIST
Author :
Domae, A. ; Nakamura, Y. ; Ichikawa, Y.
Author_Institution :
Nat. Metrol. Inst. of Japan, AIST, Tsukuba
fDate :
June 27 2004-July 2 2004
Abstract :
To provide calibrations of standard capacitors of 0.01-1 muF, a four terminal-pair bridge has been developed. The combined standard uncertainty in the calibration of the 0.01 muF capacitor based on a quantized Hall resistance was estimated to be 0.54times10-6
Keywords :
Hall effect; bridge instruments; calibration; capacitance measurement; capacitors; measurement standards; measurement uncertainty; 0.1 to 1 muF; bridge instruments; capacitance measurement; four terminal-pair bridge; measurement standards; measurement uncertainty; quantized Hall resistance; standard capacitor calibration; standard uncertainty; Bridge circuits; Calibration; Capacitance measurement; Capacitors; Ceramics; Instruments; Measurement standards; Metrology; Standards development; Temperature;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8493-8
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305421
