Direct method for shear moduli calculation from quartz crystal resonator measurements

Author

Behling, Carsten ; Lucklum, Ralf ; Hauptman, Peter

Author_Institution

Magdeburg Univ., Germany

fYear

1998

fDate

27-29 May 1998

Firstpage

823

Lastpage

830

Abstract

Quartz crystal resonator measurements can be used for polymer material characterization. The non-gravimetric behavior of these resonators, i.e. the dependence of the electrical response of polymer coated quartz resonators on the polymer shear modulus, is exploited for the determination of viscoelastic material properties of the coating. Previously reported methods applied an electrical admittance analysis together with difficult and time-consuming data fit procedures to calculate the film shear modulus. This contribution presents a new direct method for the determination of complex shear moduli of polymer films from quartz crystal resonator measurements which allows a fast calculation of the shear parameters

Keywords

crystal resonators; elastic moduli measurement; electric sensing devices; polymer films; shear modulus; SiO₂; complex shear moduli; electrical admittance analysis; electrical response; film shear modulus; gravimetric measurement; on-gravimetric behavior; polymer coated quartz resonators; polymer films; polymer shear modulus; quartz crystal resonator measurements; shear moduli calculation; viscoelastic material properties; Acoustic measurements; Acoustic sensors; Coatings; Crystalline materials; Elasticity; Frequency; Material properties; Polymer films; Surface acoustic waves; Viscosity;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International

Conference_Location

Pasadena, CA

ISSN

1075-6787

Print_ISBN

0-7803-4373-5

Type

conf

DOI

10.1109/FREQ.1998.717995

Filename

717995