DocumentCode :
3450022
Title :
Direct method for shear moduli calculation from quartz crystal resonator measurements
Author :
Behling, Carsten ; Lucklum, Ralf ; Hauptman, Peter
Author_Institution :
Magdeburg Univ., Germany
fYear :
1998
fDate :
27-29 May 1998
Firstpage :
823
Lastpage :
830
Abstract :
Quartz crystal resonator measurements can be used for polymer material characterization. The non-gravimetric behavior of these resonators, i.e. the dependence of the electrical response of polymer coated quartz resonators on the polymer shear modulus, is exploited for the determination of viscoelastic material properties of the coating. Previously reported methods applied an electrical admittance analysis together with difficult and time-consuming data fit procedures to calculate the film shear modulus. This contribution presents a new direct method for the determination of complex shear moduli of polymer films from quartz crystal resonator measurements which allows a fast calculation of the shear parameters
Keywords :
crystal resonators; elastic moduli measurement; electric sensing devices; polymer films; shear modulus; SiO2; complex shear moduli; electrical admittance analysis; electrical response; film shear modulus; gravimetric measurement; on-gravimetric behavior; polymer coated quartz resonators; polymer films; polymer shear modulus; quartz crystal resonator measurements; shear moduli calculation; viscoelastic material properties; Acoustic measurements; Acoustic sensors; Coatings; Crystalline materials; Elasticity; Frequency; Material properties; Polymer films; Surface acoustic waves; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
Conference_Location :
Pasadena, CA
ISSN :
1075-6787
Print_ISBN :
0-7803-4373-5
Type :
conf
DOI :
10.1109/FREQ.1998.717995
Filename :
717995
Link To Document :
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