Title :
High-Tc superconducting microstrip resonators and filters on LaAlO3
Author :
Takemoto, June H. ; Jackson, Charles M. ; Hu, Roger ; Manasevit, Harold M. ; Petite-Hall, Claire ; Burch, John F. ; St.John, D.C. ; Lee, Alfred ; Daly, Ken P.
Author_Institution :
TRW Space & Technol. Group, Redondo Beach, CA, USA
Abstract :
The authors discuss recent developments in high-Q microstrip resonators and filters using various deposition processes. They successfully developed sputtering, metalorganic vapor deposition (MOCVD), and laser deposition processes that produces high-quality high- Tc superconducting (HTS) films on LaAlO3. For the double-sided MOCVD process, replacing the Ag ground plane with an HTS ground plane in silver ground plane eliminates extra surface losses due to normal metal ground conductors. These two-sided microwave circuits yield higher microwave performances than one-sided HTS circuits and much higher performance than identical Ag circuits. HTS surface resistances less than 330 μΩ at 10 GHz were achieved. Q-values of 9600 at 1.3 GHz were achieved in meanderline resonators
Keywords :
CVD coatings; Q-factor; chemical vapour deposition; high-temperature superconductors; lanthanum compounds; resonators; sputter deposition; sputtered coatings; strip line components; substrates; superconducting devices; superconducting thin films; 1.3 GHz; 10 GHz; 330 muohm; HTS ground plane; LaAlO3 substrates; MOCVD; Q-factors; Q-values; deposition processes; high temperature superconductors; high-Q resonators; laser deposition processes; meanderline resonators; metalorganic vapor deposition; microstrip filters; microstrip resonators; sputter deposition; superconducting resonators; High temperature superconductors; MOCVD; Microstrip filters; Microstrip resonators; Microwave circuits; Resonator filters; Sputtering; Superconducting films; Superconducting filters; Superconducting microwave devices;
Conference_Titel :
Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-87942-658-6
DOI :
10.1109/FREQ.1991.145938
