DocumentCode
3450098
Title
Primality and identity testing via Chinese remaindering
Author
Agrawal, Manindra ; Biswas, Somenath
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India
fYear
1999
fDate
1999
Firstpage
202
Lastpage
208
Abstract
Gives a simple and new primality testing algorithm by reducing primality testing for a number n to testing if a specific univariate identity over Zn holds. We also give new randomized algorithms for testing if a multivariate polynomial, over a finite field or over rationals, is identically zero. The first of these algorithms also works over Zn for any n. The running time of the algorithms is polynomial in the size of the arithmetic circuit representing the input polynomial and the error parameter. These algorithms use fewer random bits and work for a larger class of polynomials than all the previously known methods, e.g. the Schwartz-Zippel test (J.T. Schwartz, 1980; R.E. Zippel, 1979), the Chen-Kao (1997) test and the Lewin-Vadhan (1998) test. Our algorithms first transform the input polynomial to a univariate polynomial and then use Chinese remaindering over univariate polynomials to effectively test if it is zero
Keywords
computational complexity; number theory; randomised algorithms; testing; Chen-Kao test; Chinese remainder theorem; Lewin-Vadhan test; Schwartz-Zippel test; arithmetic circuit size; error parameter; finite field; identity testing algorithm; input polynomial; multivariate polynomial; polynomial-time algorithms; primality testing algorithm; random bits; randomized algorithms; rational numbers; univariate identity; univariate polynomial; Arithmetic; Binary decision diagrams; Circuits; Computer science; Polynomials; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Foundations of Computer Science, 1999. 40th Annual Symposium on
Conference_Location
New York City, NY
ISSN
0272-5428
Print_ISBN
0-7695-0409-4
Type
conf
DOI
10.1109/SFFCS.1999.814592
Filename
814592
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