DocumentCode
3450139
Title
A redundancy technique for ultra-high-speed SRAMs
Author
Nambu, Hiroaki ; Kanetani, Kazuo ; Idei, Youji ; Homma, Noriyuki ; Hiramoto, Toshirou ; Tamba, Nobuo ; Odaka, Masanori ; Watanabe, Kunihiko ; Ikeda, Takahide ; Ohhata, Kenichi ; Sakurai, Yoshiaki ; Yamaguchi, Kunihiko
fYear
1991
fDate
9-10 Sep 1991
Firstpage
139
Lastpage
141
Abstract
A redundancy technique suitable for ultra-high-speed SRAMs is developed using focused-ion-beam and laser-chemical-vapor-deposition. This technique is applied to a 64 Kb SRAM with a 1.5 ns access time without deterioration of the ultra-high-speed characteristics
Keywords
Added delay; BiCMOS integrated circuits; Circuit simulation; Circuit testing; Delay effects; Driver circuits; Fuses; Laboratories; Protection; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar Circuits and Technology Meeting, 1991., Proceedings of the 1991
Conference_Location
Minneapolis, MN
Print_ISBN
0-7803-0103-X
Type
conf
DOI
10.1109/BIPOL.1991.160972
Filename
160972
Link To Document