• DocumentCode
    3450312
  • Title

    A new IGBT structure with a wider safe operating area (SOA)

  • Author

    Thaper, N. ; Baliga, B.J.

  • Author_Institution
    Power Semicond. Res. Center, North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1994
  • fDate
    31 May-3 Jun 1994
  • Firstpage
    177
  • Lastpage
    182
  • Abstract
    A new IGBT structure incorporating a shallow diverter between adjacent cells is proposed in this paper with the aim of widening the Forward Bias Safe Operating Area (FBSOA) of the IGBT. The latchup limit of the IGBT increased from 700 A/cm2 to 1100 A/cm2 in case of the n-channel IGBT and from 1200 A/cm2 to 2100 A/cm2 for the p-channel IGBT. Although there was a no improvement in the dynamic avalanche limit in the case of the p-channel IGBT, it improved significantly for the n-channel IGBT making its FBSOA much wider than that of the conventional IGBT. The incorporation of the diverter was found to result in an increase in the forward voltage drop (at a current density of 200 A/cm2) from 1.7 V to 2.3 V and -2.3 V to -3.9 V for the n- and the p-channel IGBT, respectively
  • Keywords
    insulated gate bipolar transistors; -3.9 to 2.3 V; IGBT structure; dynamic avalanche limit; forward voltage drop; forward-biased SOA; latchup limit; n-channel IGBT; p-channel IGBT; safe operating area; shallow diverter; Avalanche breakdown; Current density; Electron emission; Insulated gate bipolar transistors; Metallization; Motor drives; Semiconductor optical amplifiers; Switching circuits; Threshold voltage; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
  • Conference_Location
    Davos
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-1494-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.1994.583697
  • Filename
    583697