Title :
The Shot Noise Thermometer: Primary Electronic Thermometry using the Noise from a Tunnel Junction
Author :
Spietz, Lafe ; Lehnert, K.W. ; Siddiqi, I. ; Schoelkopf, R.J.
Author_Institution :
Dept. of Appl. Phys. & Phys., Yale Univ., New Haven, CT
Abstract :
We present a thermometer based on the electrical noise from a tunnel junction. In this thermometer, temperature is related to voltage across the junction by a relative microwave noise measurement with only the use of the electron charge, Boltzmann´s constant, and assumption that electrons in a metal obey Fermi-Dirac statistics (Lafe Spietz, 2003)
Keywords :
constants; electric noise measurement; microwave measurement; quantum statistical mechanics; thermometers; Boltzmann constant; Fermi-Dirac statistics; electrical noise; electron charge; electronic thermometry; microwave noise measurement; shot noise thermometer; tunnel junction; Acoustical engineering; Current measurement; Electrons; Microwave measurements; Noise measurement; Physics; Reservoirs; Temperature distribution; Tunneling; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305436
