DocumentCode
3450412
Title
InxGa1-xSb of highly uniform composition
Author
Manea, A.S. ; Munteanu, I. ; Losofatu, M. ; Lazarescu, M.F. ; Cruceru, Madalina ; Grigorescu, Cristiana
Author_Institution
Inst. of Phys. & Technol. of Mater., Bucharest, Romania
fYear
1995
fDate
11-14 Oct 1995
Firstpage
297
Lastpage
300
Abstract
This paper reports on InxGa1-xSb (x=0.20) bulk crystals of uniform composition obtained by rapid, direct synthesis from the elements. The uniformity of the composition has been checked out by Neutron Activation Analysis (NAA). Hall effect and specific resistance measurements have been performed within the temperature range of 77 K-310 K. For all the investigated samples p-type conductivity results
Keywords
Hall effect; III-V semiconductors; crystal growth from melt; electrical conductivity; gallium arsenide; indium compounds; neutron activation analysis; semiconductor growth; 77 to 310 K; Hall effect; InxGa1-xSb bulk crystals; InGaSb; compositional uniformity; direct synthesis; neutron activation analysis; p-type conductivity; specific resistance; Composite materials; Crystalline materials; Crystallization; Epitaxial growth; Isotopes; Neutrons; Semiconductor materials; Semiconductor thin films; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1995. CAS'95 Proceedings., 1995 International
Conference_Location
Sinaia
Print_ISBN
0-7803-2647-4
Type
conf
DOI
10.1109/SMICND.1995.494920
Filename
494920
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