DocumentCode :
345048
Title :
Beam profile measurement at 30 GeV using optical transition radiation
Author :
Catravas, P. ; Leemans, W.P. ; Esarey, E. ; Zolotorev, M. ; Whittum, D. ; Iverson, R. ; Hogan, M. ; Walz, D.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
Volume :
3
fYear :
1999
fDate :
1999
Firstpage :
2111
Abstract :
We present results of measurements of spot size and angular divergence of a 30 GeV electron beam though use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm, for both the single and double foil configurations. Electron beam spot sizes of 50 μm rms have been resolved, demonstrating the utility of OTR for measurement of small beam spot sizes of high energy (30 GeV) electron beams. Two-foil interference was clearly observed and utilized to extract electron beam angular divergences of ~100 μrad
Keywords :
electron beams; particle beam diagnostics; transition radiation detectors; 30 GeV; angular divergence; beam profile measurement; double foil configurations; electron beam angular divergences; far field distribution; near field pattern; optical transition radiation; single foil configurations; spot size; Electron beams; Electron optics; Energy resolution; Forward contracts; Interference; Particle accelerators; Particle beams; Size measurement; Spatial resolution; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location :
New York, NY
Print_ISBN :
0-7803-5573-3
Type :
conf
DOI :
10.1109/PAC.1999.794389
Filename :
794389
Link To Document :
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