Beam profile measurement at 30 GeV using optical transition radiation

Author

Catravas, P. ; Leemans, W.P. ; Esarey, E. ; Zolotorev, M. ; Whittum, D. ; Iverson, R. ; Hogan, M. ; Walz, D.

Author_Institution

Lawrence Berkeley Lab., CA, USA

Volume

3

fYear

1999

fDate

1999

Firstpage

2111

Abstract

We present results of measurements of spot size and angular divergence of a 30 GeV electron beam though use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm, for both the single and double foil configurations. Electron beam spot sizes of 50 μm rms have been resolved, demonstrating the utility of OTR for measurement of small beam spot sizes of high energy (30 GeV) electron beams. Two-foil interference was clearly observed and utilized to extract electron beam angular divergences of ~100 μrad

Keywords

electron beams; particle beam diagnostics; transition radiation detectors; 30 GeV; angular divergence; beam profile measurement; double foil configurations; electron beam angular divergences; far field distribution; near field pattern; optical transition radiation; single foil configurations; spot size; Electron beams; Electron optics; Energy resolution; Forward contracts; Interference; Particle accelerators; Particle beams; Size measurement; Spatial resolution; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1999. Proceedings of the 1999

Conference_Location

New York, NY

Print_ISBN

0-7803-5573-3

Type

conf

DOI

10.1109/PAC.1999.794389

Filename

794389