Title :
Modeling and analysis of analog single event transients in an amplifier circuit
Author :
Yongsheng Wang ; Wenjuan Wang ; Yunfei Du ; Bei Cao
Author_Institution :
Micro-Electron. Dept., Harbin Inst. of Technol., Harbin, China
Abstract :
Simulations are used to characterize the single event transient current and voltage waveforms in the common source amplifier with resistive load implemented using SMIC 0.18μm technology. The simulations are all carried out using the circuit and device-level mixed mode with TCAD tools. Results show that the amplitude of the current pulse is depending on the input voltage of the circuit. And when the LET of the incidence particle is higher enough the transient current waveforms do not obey the classical double exponential model.
Keywords :
integrated circuit modelling; network analysis; pulse amplifiers; technology CAD (electronics); LET; SMIC technology; TCAD tools; amplifier circuit; analog single event transient current waveforms; classical double exponential model; common source amplifier; current pulse amplitude; device-level mixed mode; incidence particle; single event voltage waveforms; size 0.18 mum; Integrated circuit modeling; Load modeling; Shape; Solid modeling; Three-dimensional displays; Transient analysis; Transistors; Common-Source amplifier; pulse amplitude; pulse shape; single event transient;
Conference_Titel :
Optoelectronics and Microelectronics (ICOM), 2013 International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4799-1214-8
DOI :
10.1109/ICoOM.2013.6626499
