DocumentCode
3450754
Title
Turnkey compact frequency standard at 1556 nm based on Rb two-photon transitions
Author
Cliche, J.F. ; Latrasse, C. ; Têtu, M. ; Babin, A. ; Tremblay, S. ; Tranchart, S. ; Poulin, D.
Author_Institution
DiCOS Technol., Quebec, Que.
fYear
2004
fDate
38139
Firstpage
674
Lastpage
675
Abstract
DiCOS Technologies has developed a high coherence fully automated absolute frequency standard for metrology applications. It uses a 1556 nm narrow linewidth DFB fiber laser locked to a two-photon transition in rubidium 85 at 778 nm after second harmonic generation in a non-linear waveguide crystal. Its main features and performances are presented in this paper
Keywords
frequency measurement; measurement standards; optical variables measurement; 1556 nm; 778 nm; DFB fiber laser; DiCOS technologies; Rb two-photon transitions; metrology applications; nonlinear waveguide crystal; second harmonic generation; turnkey compact frequency standard; two photon transition; Fiber lasers; Fiber nonlinear optics; Frequency; Laser transitions; Nonlinear optics; Optical filters; Optical harmonic generation; Optical interferometry; Optical waveguides; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location
London
Print_ISBN
0-7803-8494-6
Electronic_ISBN
0-7803-8494-6
Type
conf
DOI
10.1109/CPEM.2004.305475
Filename
4097430
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