Title :
Turnkey compact frequency standard at 1556 nm based on Rb two-photon transitions
Author :
Cliche, J.F. ; Latrasse, C. ; Têtu, M. ; Babin, A. ; Tremblay, S. ; Tranchart, S. ; Poulin, D.
Author_Institution :
DiCOS Technol., Quebec, Que.
Abstract :
DiCOS Technologies has developed a high coherence fully automated absolute frequency standard for metrology applications. It uses a 1556 nm narrow linewidth DFB fiber laser locked to a two-photon transition in rubidium 85 at 778 nm after second harmonic generation in a non-linear waveguide crystal. Its main features and performances are presented in this paper
Keywords :
frequency measurement; measurement standards; optical variables measurement; 1556 nm; 778 nm; DFB fiber laser; DiCOS technologies; Rb two-photon transitions; metrology applications; nonlinear waveguide crystal; second harmonic generation; turnkey compact frequency standard; two photon transition; Fiber lasers; Fiber nonlinear optics; Frequency; Laser transitions; Nonlinear optics; Optical filters; Optical harmonic generation; Optical interferometry; Optical waveguides; Waveguide lasers;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305475
