Title :
LES simulation of near-field spray process and atomization characteristics of impulse anti-riots water cannon
Author :
Zhuang Hongwei ; Zhan Renjun ; Zhao Fadong ; Xu Liang
Author_Institution :
Equip. & Transp. Dept., CAPF, Xi´an, China
Abstract :
Through Computational Fluid Dynamic(CFD) simulation method, One-Equation Large Eddy Simulation(LES) model coupled with the bounded and compressed VOF method was used to simulate the near-field of impulse anti-riots water cannon for the study of its operational properties and application. The instantaneous isosurfaces of liquid-phase volume fraction and the high-speed photographs were compared. They are agreed with each other in the spray configuration and jet penetration length. The spray process is divided into three phases: liquid column burst, secondary burst, liquid film rupture. The inflation of the high-pressure gas is considered to be the most dominant factor in the near-field. The influence of initial conditions on the atomization characteristics was investigated by condition-changing simulation. The conclusions provide guidance for further study and its operational application.
Keywords :
computational fluid dynamics; flow simulation; jets; sprays; streak photography; two-phase flow; weapons; atomization characteristics; bounded VOF method; compressed VOF method; computational fluid dynamic simulation method; condition-changing simulation; high-pressure gas inflation; high-speed photographs; impulse antiriot water cannon; initial conditions; instantaneous isosurfaces; jet penetration length; liquid column burst; liquid film rupture; liquid-phase volume fraction; near-field spray process; one-equation large eddy simulation model; operational applications; operational properties; secondary burst; spray configuration; Computational modeling; Equations; Films; Mathematical model; Numerical models; Viscosity; LES model; atomization characteristic; bounded and compressed VOF method; impulse anti-riots water cannon;
Conference_Titel :
Information Technology and Artificial Intelligence Conference (ITAIC), 2011 6th IEEE Joint International
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-8622-9
DOI :
10.1109/ITAIC.2011.6030366