Title :
Analysis of GTO failure mode during DC voltage blocking
Author :
Matsuda, H. ; Fujiwara, T. ; Hiyoshi, M. ; Nishitani, K. ; Kuwako, A. ; Ikehara, T.
Author_Institution :
Semicond. Group, Toshiba Corp., Kawasaki, Japan
fDate :
31 May-3 Jun 1994
Abstract :
GTOs suddenly failed without any leakage current increase before the failure event, during DC voltage blocking. From various experiments and the analysis, we have come to the inference that the GTO failure was caused by cosmic-rays at sea level. The failure rate of the improved GTOs decreases by more than one order
Keywords :
thyristors; DC voltage blocking; GTO failure mode; cosmic-rays; failure event; failure rate; sea level; Anodes; Concrete; Failure analysis; Laboratories; Leakage current; Neutrons; Protons; Sea level; Testing; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
Conference_Location :
Davos
Print_ISBN :
0-7803-1494-8
DOI :
10.1109/ISPSD.1994.583727
