High precision electron beam diagnostic system for high current long pulse beams

As part of the effort to develop a multi-axis electron beam transport system using stripline kicker technology for DARHT II applications, it is necessary to precisely determine the position and extent of long high energy beams (6-40 MeV, 1-4 kA, 2 microseconds) for accurate position control. The kicker positioning system utilizes shot-to-shot adjustments for reduction of relatively slow (<20 MHz) motion of the beam centroid. The electron beams passing through the diagnostic systems have the potential for large halo effects that tend to corrupt measurements performed using capacitive pickoff probes. Likewise, transmission line traveling wave probes have problems with multi-bounce effects due to these longer pulse widths. Finally, the high energy densities experienced in these applications distort typical foil beam position measurements