• DocumentCode
    3450882
  • Title

    Turing´s instability as a failure mechanism of GTOs

  • Author

    Gorbatyuk, A.V. ; Rodin, P.B.

  • Author_Institution
    A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
  • fYear
    1994
  • fDate
    31 May-3 Jun 1994
  • Firstpage
    227
  • Lastpage
    231
  • Abstract
    The destructive phenomena caused by the so called Turing´s instability (periodic in space) is illustrated for the case of GTO switching-off process. Using the simplified 3D analytical approach it is shown that this instability can emerge when the whole system still remains in the state with the positive differential resistance but the differential resistance of its active “hidden” part yet becomes negative. The suggested model explains satisfactorily the experiments on spatially periodic destruction of GTO and predicts the same type of failure behavior for other thyristor-like devices
  • Keywords
    failure analysis; 3D analytical approach; GTOs; Turing´s instability; destructive phenomena; failure behavior; failure mechanism; model; positive differential resistance; spatially periodic destruction; switching-off process; thyristor-like devices; Cathodes; Chemical technology; Electric breakdown; Extraterrestrial phenomena; Failure analysis; Pattern formation; Predictive models; Solids; Thyristors; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
  • Conference_Location
    Davos
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-1494-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.1994.583728
  • Filename
    583728