Title :
Kirk effect limitations in high voltage IC´s
Author :
Ludikhuize, A.W.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
fDate :
31 May-3 Jun 1994
Abstract :
The voltage handling capability of Resurf LDMOS and of junction isolated islands in HV IC´s is observed to decrease at high current density. This is attributed to the Kirk effect
Keywords :
power integrated circuits; Kirk effect; Resurf LDMOS; current density; high voltage ICs; junction isolated islands; voltage handling; Current density; Current measurement; Intrusion detection; Kirk field collapse effect; Laboratories; P-n junctions; Power transistors; Pulse measurements; Space charge; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
Conference_Location :
Davos
Print_ISBN :
0-7803-1494-8
DOI :
10.1109/ISPSD.1994.583734
