DocumentCode :
3451037
Title :
CA optimization based on simulation annealing in BIST
Author :
Bei Cao ; Yongsheng Wang ; Yanwei Dou ; Dan Bu ; Bin Zhou
Author_Institution :
Electron. Sci. & Technol. Post-Doctoral Res. Center, Heilongjiang Univ., Harbin, China
fYear :
2013
fDate :
7-9 Sept. 2013
Firstpage :
138
Lastpage :
141
Abstract :
The deterministic test patterns generator in BIST often suffer from the problems that it requires extra test power consumption, area overhead and the idle test cycles between the test patterns. This paper proposes an efficient strategy for synthesizing a built-in test pattern generator that can generate a given set of predetermined low power test patterns for reducing the test power of a circuit under test (CUT) without modifying the initial fault coverage. The technique is based on the cellular automata (CA) model for testing combinational circuits. The algorithm we present based on simulation annealing (SA) that can optimize a CA structure to generate given low power test sequence by adjusting dynamically cell neighborhood range of CA. The results of simulation using benchmark combinational circuits showed that the designing generator is efficient to generate the deterministic test sequences in terms of power consumption, fault coverage, test time and area overhead compared to alternative solution.
Keywords :
cellular automata; circuit optimisation; combinational circuits; integrated optoelectronics; physics computing; power consumption; simulated annealing; BIST; CA optimization; build-in self-test; cellular automata; circuit under test; combinational circuits; deterministic test patterns generator; fault coverage; power consumption; simulation annealing; test time; Algorithm design and analysis; Automata; Built-in self-test; Generators; Power demand; Simulated annealing; Test pattern generators; BIST; CA; simulation annealing; test pattern generatio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronics and Microelectronics (ICOM), 2013 International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4799-1214-8
Type :
conf
DOI :
10.1109/ICoOM.2013.6626511
Filename :
6626511
Link To Document :
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