Title :
Optical damage of dielectrics down to 5 fs
Author :
Lenzner, Matthias ; Sartania, S. ; Spielmann, C. ; Krausz, F. ; Kruger, Jorg ; Kautek, W.
Author_Institution :
Abt. Quantenelektronik und Lasertechnik, Technische Universitat Wien
Keywords :
Cooling; Delay effects; Dielectrics; Electrons; Energy resolution; Kinetic energy; Photoelectricity; Probes; Silicon; Temperature;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4125-2
DOI :
10.1109/CLEO.1997.603038
