Title :
Checking integrity during dynamic reordering in decision diagrams
Author_Institution :
Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany
Abstract :
Decision Diagrams (DDs) are the state-of-the-art data structure in VLSI CAD. They are used in many safety critical applications, like verification. Recently a new approach based on recursive checksum computation has been presented that showed how the correctness of the data structures could be verified by on-line and off-line tests. In this paper it is shown that these techniques can also be integrated in DD packages making use of dynamic reordering methods, like variable reordering and reordering based synthesis. The correctness of the data structures can be verified by (nearly) no overhead. Experimental results are presented to demonstrate the efficiency of this approach
Keywords :
VLSI; circuit CAD; data integrity; data structures; decision diagrams; VLSI CAD; data integrity; data structure; decision diagrams; dynamic reordering; recursive checksum computation; safety critical applications; variable reordering; Application software; Boolean functions; Circuits; Computer science; Data structures; Design automation; Minimization methods; Packaging; Protocols; Very large scale integration;
Conference_Titel :
EUROMICRO Conference, 1999. Proceedings. 25th
Conference_Location :
Milan
Print_ISBN :
0-7695-0321-7
DOI :
10.1109/EURMIC.1999.794492