DocumentCode :
3451402
Title :
Monte Carlo simulation of HEMT
Author :
Ueno, H. ; Yamakawa, S. ; Hamaguchi, C. ; Miyatsuji, K.
Author_Institution :
Dept. of Electron. Eng., Osaka Univ., Japan
fYear :
1995
fDate :
7-9 Nov 1995
Firstpage :
85
Lastpage :
89
Abstract :
Device simulation of HEMT (High Electron Mobility Transistor) has been carried out by ensemble Monte Carlo simulation. Since the electrons in HEMT are confined in GaAs region at the GaAs-AlGaAs hetero-interface, their motion is two-dimensional when the electron energy is low and thus we have to take into account the quantization of electrons at the interface. In order to develop a realistic device simulator of HEMT, we divide the channel region in meshes, and Schrodinger and Poisson equations are solved self-consistently to obtain electronic states of the two-dimensional electrons in a mesh. In addition the real space transfer from GaAs layer into AlGaAs barrier layer is taken into account
Keywords :
III-V semiconductors; Monte Carlo methods; Schrodinger equation; aluminium compounds; gallium arsenide; high electron mobility transistors; semiconductor device models; GaAs-AlGaAs; GaAs-AlGaAs hetero-interface; HEMT; Monte Carlo simulation; Poisson equation; Schrodinger equation; channel region; device simulator; electronic states; real space transfer; two-dimensional electrons; Cities and towns; D-HEMTs; Electrons; Gallium arsenide; HEMTs; Monte Carlo methods; Particle scattering; Power engineering and energy; Quantization; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics and Computer Modeling of Devices Based on Low-Dimensional Structures, 1995. Proceedings., International Workshop on
Conference_Location :
Aizu-Wakamatsu
Print_ISBN :
0-8186-7321-4
Type :
conf
DOI :
10.1109/PCMDLS.1995.494965
Filename :
494965
Link To Document :
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