Title :
Determination of base and emitter delay time in advanced self-aligned bipolar technology
Author :
Chiu, Tzu-Yin ; Liu, Mark T Y ; Lee, Kwing F.
Author_Institution :
AT&T Bell Lab., Holmdel, NJ, USA
Abstract :
A method for experimentally determining the base and emitter delay time is described. It is based on direct monitoring of excess charge in the base and fT measurement as a function of collector current and base-collector voltage. The sum of the excess carrier mobilities is extracted directly from these measurements
Keywords :
bipolar integrated circuits; bipolar transistors; integrated circuit technology; time measurement; base delay time; base-collector voltage; collector current; delay time measurement; device physics; direct monitoring of excess charge; emitter delay time; excess carrier mobilities; fT measurement; self-aligned bipolar technology; Analytical models; Charge measurement; Current density; Current measurement; Delay effects; Doping; Electrical resistance measurement; Monitoring; Niobium; Voltage measurement;
Conference_Titel :
Bipolar Circuits and Technology Meeting, 1991., Proceedings of the 1991
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-0103-X
DOI :
10.1109/BIPOL.1991.160978
