Title :
Application of BIT design for electric vehicle (EV)
Author :
Xiao, Shan Qing ; Chun, Pan Meng ; Bing, Weng Fei
Author_Institution :
Dept. of Mechatronic & Instrum., Nat. Univ. of Defence Technol., Hunan, China
Abstract :
This paper describes the built-in-test (BIT) design of electric vehicles. An electric vehicle, driven by an AC motor, requires high-reliability and easy repairability. BIT design, is therefore used in the authors´ system. As for the electric vehicle, BIT before task, BIT in task, and BIT for repairs are adopted. The hardware and software of the system are so designed as to meet the test requirements
Keywords :
AC motor drives; automatic testing; built-in self test; electric vehicles; machine testing; maintenance engineering; reliability; traction motor drives; AC motor drive; BIT design; application; built-in-test design; electric vehicle; hardware; reliability; repairability; software; Automatic testing; Built-in self-test; Control systems; Digital signal processing; Electric vehicles; Inverters; Relays; System testing; Vehicle detection; Voltage control;
Conference_Titel :
Power Electronics and Drive Systems, 1999. PEDS '99. Proceedings of the IEEE 1999 International Conference on
Print_ISBN :
0-7803-5769-8
DOI :
10.1109/PEDS.1999.794617
